An Xps Study of Solid Solutions Mo1–XNbxS2 (0 < x < 0.15)


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Аннотация

Solid solutions Mo1–xNbxS2 (x = 0, 0.05, 0.10, and 0.15) crystallizing in the hexagonal structure 2H-MoS2 are synthesized. The samples are characterized by powder X-ray diffraction (XRD) and Raman spectroscopies, X-ray photoelectron spectroscopy (XPS), and quantum chemical calculations (DFT). The changes occurring in the electronic properties of high-resistivity semiconductor MoS2 and indicating metallic behavior of obtained solid solutions Mo1–xNbxS2 are not accompanied by substantial changes in the atomic photoelectron spectra.

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Авторлар туралы

A. Ledneva

Nikolaev Institute of Inorganic Chemistry, Siberian Branch

Email: fed@niic.nsc.ru
Ресей, Novosibirsk

S. Dalmatova

Nikolaev Institute of Inorganic Chemistry, Siberian Branch; Novosibirsk State University

Email: fed@niic.nsc.ru
Ресей, Novosibirsk; Novosibirsk

A. Fedorenko

Nikolaev Institute of Inorganic Chemistry, Siberian Branch

Email: fed@niic.nsc.ru
Ресей, Novosibirsk

I. Asanov

Nikolaev Institute of Inorganic Chemistry, Siberian Branch; Novosibirsk State University

Email: fed@niic.nsc.ru
Ресей, Novosibirsk; Novosibirsk

A. Enyashin

Institute of Solid State Chemistry, Ural Branch

Email: fed@niic.nsc.ru
Ресей, Ekaterinburg

L. Mazalov

Nikolaev Institute of Inorganic Chemistry, Siberian Branch; Novosibirsk State University

Email: fed@niic.nsc.ru
Ресей, Novosibirsk; Novosibirsk

V. Fedorov

Nikolaev Institute of Inorganic Chemistry, Siberian Branch; Novosibirsk State University

Хат алмасуға жауапты Автор.
Email: fed@niic.nsc.ru
Ресей, Novosibirsk; Novosibirsk

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© Journal of Structural Chemistry, 2018