Application specific integrated circuits in radiation measuring systems (Review, Part 2)


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

The purpose of this review is to give experts, who use electronic techniques in experiments or measurements in applied areas, whenever it is possible, a complete picture of the past five-year rapid development of application specific integrated circuits for readouts and processing of signals from up-to-date detectors of nuclear particles. Due to the large information content, the review is formally divided into two parts. The use of the application specific integrated circuits in different experimental or measuring plants is considered in this second part. Both parts have the common classification table, numbering of cited papers, drawings, and formulas.

Авторлар туралы

S. Basiladze

Skobel’tsyn Research Institute of Nuclear Physics

Хат алмасуға жауапты Автор.
Email: basilad@mail.cern.ch
Ресей, Moscow, 119991

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML

© Pleiades Publishing, Inc., 2016